Towards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy
Y. Zhu, A. Soukiassian, D.G. Schlom, D.A. Muller, C. Dwyer
Appl. Phys. Lett. 103 (14), 141908 (2013).

LaAlO₃ stoichiometry is key to electron liquid formation at LaAlO₃/SrTiO₃ interfaces
M.P. Warusawithana, C. Richter, J.A. Mundy, P. Roy, J. Ludwig, S. Paetel, T. Heeg, A.A. Pawlicki, L.F. Zhu Ye, M. Zheng, M. Lee, B. Mulcahy, W. Zander, Y. Zhu, J. Schubert, J.N. Eckstein, D.A. Muller, C.S. Hellberg, J. Mannhart, D.G. Schlom
Nature Communications 4, 2351 (2013).

Compositional analysis of GaAs/AlGaAs heterostructures using quantitative scanning transmission electron microscopy
H. Kauko, C.L. Zheng, Y. Zhu, S. Glanvill, C. Dwyer, A.M. Munshi, B.O. Fimland, A.T.J. van Helvoort, J. Etheridge
Appl. Phys. Lett. 103 (23), 232111 (2013).

Effect of reduced dimensionality on the optical band gap of SrTiO₃
C.-H. Lee, N.J. Podraza, Y. Zhu, R.F. Berger, S. Shen, M. Sestak, R.W. Collins, L.F. Zhu Ye, J.A. Mundy, H. Wang, Q. Mao, X.X. Xi, L.J. Brillson, J.B. Neaton, D.A. Muller, D.G. Schlom
Appl. Phys. Lett. 102 (12), 122901 (2013).

Fast flexible electronics with strained silicon nanomembranes
H. Zhou, J.-H. Seo, D.M. Paskiewicz, Y. Zhu, G.K. Celler, P.M. Voyles, W. Zhou, M.G. Lagally, Z. Ma
Scientific Reports 3, 1291 (2013).

Determining on-axis crystal thickness with quantitative position-averaged incoherent bright-field signal in an aberration-corrected STEM
H.L. Xin, Y. Zhu, D.A. Muller,
Microsc. Microanal. 18 (4), 720 (2012).

Direct determination of the effect of strain on domain morphology in ferroelectric superlattices with scanning probe microscopy
K. Kathan-Galipeau, P.P. Wu, Y.L. Li, L.Q. Chen, A. Soukiassian, Y. Zhu, D.A. Muller, X.X. Xi, D.G. Schlom, D.A. Bonnell
J. Appl. Phys. 112 (5), 052011 (2012).

Atomic-scale compositional mapping and 3-dimensional electron microscopy of dealloyed PtCo₃ catalyst nanoparticles with spongy multi-core/shell structures
Z. Liu, H.L. Xin, Z. Yu, Y. Zhu, J. Zhang, J.A. Mundy, D.A. Muller, F.T. Wagner
J. Electrochem. Soc. 159 (9), F554 (2012).

Effects of Mg content on dark-line defects in II-VI green converters
Y. Zhu*, J. Xie, T.J. Miller, M.A. Haase, X. Sun, S. McKernan, T.L. Smith, C.A. Leatherdale
Scripta Materialia 64 (6), 568 (2011).

Grains and grain boundaries in single-layer graphene atomic patchwork quilts
P.Y. Huang, C.S. Ruiz-Vargas, A.M. van der Zande, W.S. Whitney, M.P. Levendorf, J.W. Kevek, S. Garg, J.S. Alden, C.J. Hustedt, Y. Zhu, J. Park, P.L. McEuen, D.A. Muller
Nature 469 (7330), 389 (2011).